FIELD: information technology.
SUBSTANCE: two-dimensional spatial representation of the inspected electronic image is divided into blocks; k-level wavelet transform is performed on each block; coefficients of the performed wavelet transform are generated; statistical characteristics of the wavelet transform coefficients are calculated; a vector of statistical characteristics of the block is generated therefrom; the vector of statistical characteristic of the block is compared with vectors of statistical characteristics of electronic images known to be unmodified and with vectors of statistical characteristics of electronic images known to be modified; the block is identified as modified and orientation of axes of the rectangular coordinate grid is then successively changed J≥1 times.
EFFECT: high probability of detecting modification of an electronic image.
13 cl, 10 dwg
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Authors
Dates
2013-03-20—Published
2011-09-02—Filed