FIELD: physics.
SUBSTANCE: method of scanning space using an optoelectronic system involves scanning space on the azimuth and elevation coordinate, wherein scanning space on the azimuth coordinate is carried out with angular rate ωaz=Δφaz·Fk, where ωaz is the angular rate of scanning; Δφaz is the azimuth scanning pitch which is less than or equal to the angular dimension of the frame; fk is the frame frequency of the matrix photodetector; forming an image of space scanning zone in the plane of the matrix photodetector; transferring the image of the scanning zone from the rotating coordinate system to a fixed coordinate system associated with the plane of the matrix photodetector; further formation of the oscillatory component of movement of the image in the plane of the matrix photodetector in the direction of azimuth scanning which satisfies the relationship Δωaz=A·(2πfk)·Cos(2πfkt), where Δωaz is the additive component of angular rate of scanning, which varies with time according to a harmonic law, A is the oscillation amplitude which satisfies the condition and the parameter α1 which lies in the range π/2<α1<π, is determined from the equation where σφ is the radius of the blur circle of the lens of the optoelectronic system; frame by frame exposure of photosensitive elements of the matrix photodetector, carried out in the time interval with the centre at time t0, where the condition Cos(2πfKt0)=-1 is realised, where Δt is given from the condition the parameter α2 is determined from the equation
EFFECT: scanning space using an optoelectronic system with high frame frequency and angular resolution with increase in time for accumulation of signals by the matrix photodetector and high sensitivity of the apparatus.
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Authors
Dates
2012-07-27—Published
2011-04-15—Filed