METHOD AND APPARATUS FOR RECORDING DIFFRACTION REFLECTION CURVES Russian patent published in 2012 - IPC G01N23/20 

FIELD: physics.

SUBSTANCE: beam of X-ray radiation of a given range is directed onto an analysed crystal and intensity of X-ray radiation diffracted in the analysed crystal is determined using a detector, with successive measurement of parameters of diffraction conditions of the picked up X-ray reflection, wherein parameters of diffraction conditions are varied by modulating the interplanar distance of the picked up X-ray reflection through ultrasonic radiation.

EFFECT: possibility of recording diffraction reflection curves by controlling parameters of an X-ray beam using ultrasound.

6 cl, 4 dwg