METHOD FOR DEFECT DETECTION IN MATERIAL AND SYSTEM FOR IMPLEMENTATION OF DESCRIBED METHOD Russian patent published in 2013 - IPC G01N25/72 

Abstract RU 2476867 C2

FIELD: measurement equipment.

SUBSTANCE: defect on surface or in surface layer of moving material can be detected using the method involving the following stages: heating of material surface, receiving the thermal image data of the material surface using infrared thermographic chamber while the material surface is being heated at heating stage or cooled after heating, and defect detection by calculation of a laplacian with regard to surface temperature represented with the thermal image data. When the thermal image data is received while the material is being heated, heating device and infrared thermographic chamber is arranged so that heat energy radiated from the heating device is reflected with the material and enters the chamber. System includes a material surface temperature changing device, an infrared thermographic chamber for receiving the thermal image data of the material surface, and a device for defect detection by calculation of a laplacian.

EFFECT: possible monitoring of the state of material plates and detection of defects with high accuracy regardless of an operator's training level and sizes of defects, including under the material surface, even in case of its movement.

11 cl, 48 dwg

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RU 2 476 867 C2

Authors

Nakagava Dzuniti

Ito Tadajuki

Nisijama Tetsuo

Doki Masakhiro

Saito Kodzo

Gkharaibekh Belal

Chuakh Keng Khoo

Salaimekh Akhmad

Jamamoto Masakhiro

Takeuti Tomoja

Ito Kadzufumi

Khuan Khuasjun

Bokhun Shon K.

Dates

2013-02-27Published

2008-09-17Filed