FIELD: electrical engineering.
SUBSTANCE: method for rejecting semiconductor products involves measurement of informative electric parameter(s) with each product, such parameter measurement carried out after five instances of exposure to maximum allowed voltage varied polarity electrostatic discharge and after 24 hours of thermal training at the maximum allowable crystal temperature. Following the tests results, K coefficient is calculated from the formula: K=(AESD-Ainitial)/(AESD-ATT) where Ainitial, AESD, ATT are the electric parameter values prior to testing, after exposure to electrostatic discharges and after thermal treatment respectively; depending on the K criterion specified for each type of semiconductor products one identifies non-reliable products.
EFFECT: improving testing certainty and extending semiconductor products rejection functional capabilities.
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