FIELD: measurement equipment.
SUBSTANCE: invention relates to technology for measurement of thermal parameters of semiconductor items and may be used for outgoing and incoming inspection of light guides manufacturing quality. The method consists in the fact that a sequence of pulses of heating current with constant amplitude that is width-pulse modulated according to the harmonic law with modulation depth a is sent via the light diode, and in the gaps between pulses of heating current they send heating current via the light diode, following the results of voltage measurement on the light diode during action of heating current pulses and in intervals between them they determine amplitude of the first harmonics with the capacity Pm1(Ω), consumed by the light diode, and amplitude of the first harmonics of the temperature sensitive parameter
EFFECT: increased accuracy of measurement of module of thermal impedance of light diodes.
2 dwg
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Authors
Dates
2015-07-10—Published
2013-01-15—Filed