METHOD TO MEASURE THERMAL IMPEDANCE OF SEMICONDUCTING DIODES WITH USAGE OF POLYHARMONICAL MODULATION OF HEATING CAPACITY Russian patent published in 2014 - IPC G01R31/26 

Abstract RU 2507526 C1

FIELD: measurement equipment.

SUBSTANCE: method to measure thermal impedance of semiconducting diodes that consists in the fact that a sequence of heating current pulses is sent via a semiconducting diode, and their repetition cycle is constant, and a temperature sensitive parameter is measured in pauses between them - direct voltage drop on the semiconducting diode at low measurement current, and p-n transition temperature variation is determined. At the same time modulation of duration of heating current pulses is carried out in accordance with the polyharmonic law with the specified set of modulation frequencies, apparent and considerable transformants of temperature are calculated with the help of Fourier transform, using them, they calculate values of amplitudes and phases of all harmonics of temperature, afterwards they determine modules and phases of thermal impedance at all specified frequencies of modulation.

EFFECT: reduced time of process of measurement of dependence of thermal impedance on frequency of modulation of heating capacity and increased efficiency of control of thermal parameters of semiconducting diodes.

2 dwg

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RU 2 507 526 C1

Authors

Smirnov Vitalij Ivanovich

Sergeev Vjacheslav Andreevich

Korunov Dmitrij Ivanovich

Dates

2014-02-20Published

2012-07-03Filed