METHOD OF MEASURING THERMAL IMPEDANCE OF SEMICONDUCTOR DIODES USING AMPLITUDE-PULSE MODULATION OF THE GRAPPING CAPACITY Russian patent published in 2017 - IPC G01R31/26 

Abstract RU 2630191 C1

FIELD: physics.

SUBSTANCE: method consists of pre-determining the light-current characteristics of the measurement object - a semiconductor diode, passing sequence of pulses of the heating current through the diode with a constant repetition period and a varying amplitude, providing a harmonic law of modulation of the heating power, measuring in the pauses between pulses of the forward voltage of the diode with a small measuring current and determining the change in p-n transition temperature, calculated by means of the Fourier transform of the amplitude and phase of the primary harmonic transition temperature variable component, and determining the modulus and phase of the thermal impedance of the semiconductor diode.

EFFECT: providing the possibility of increasing the accuracy of measuring thermal resistance.

1 dwg

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RU 2 630 191 C1

Authors

Smirnov Vitalij Ivanovich

Gavrikov Andrej Anatolevich

Shorin Anton Mikhajlovich

Dates

2017-09-05Published

2016-03-09Filed