METHOD FOR X-RAY-FLUORESCENT DETERMINATION OF CONTENT OF METAL IMPURITIES IN THIN METAL FOILS Russian patent published in 2022 - IPC G01N23/22 

FIELD: analytical chemistry; applied physics.

SUBSTANCE: invention relates to the field of analytical chemistry and applied physics; it is intended for determination of contents of metal impurities. A method for X-ray-fluorescent determination of a content of metal impurities in thin metal foils consists in measurement of intensities of analytical lines of determined metals in a single-element sample with 100% content of a controlled element and in known studied material. As the control element, during determination of metal impurities in thin metal foils, a control sample is taken with a content of the main element of foil of 100%. The calculation of the content of the determined element is conducted taking into account an absorption factor , which is the ratio of absorption properties of the main foil element to absorption properties of the determined element, and dependence of the intensity of the analytical line of the determined element on the foil thickness. The calculation of the absorption factor and dependence of the intensity of the analytical line of the determined element on the foil thickness is conducted according to a program for calculation of theoretical intensities.

EFFECT: convenience of determination of element content is achieved.

1 cl, 1 dwg, 3 tbl