METHOD OF CALIBRATING BATCH X-RAY SPECTROMETERS Russian patent published in 2016 - IPC G01N23/22 

FIELD: measurement technology.

SUBSTANCE: invention can be used for calibration of x-ray spectrometers. Present invention comprises selecting from standard samples of structural materials composition sample with lower values count rates for all determined elements and second sample with top values count rates, from which are sets of reference samples, measuring count rate on them, that is followed by constructing a calibration curve for determination of content of monitored elements in structural material using selected two reference samples and obtained calibration dependence is accepted as a reference for further batches spectrometers, which are grouped in two reference samples of sets, reference sample with lower values of background count rate is measured count rates, and for controlled specimen with upper values count rates, which is made from a sample containing one element without impurities, measuring count rate analytical line of said element.

EFFECT: providing high-precision calibration of x-ray spectrometers.

1 cl, 6 tbl