METHOD OF X-RAY FLUORESCENCE ANALYSIS OF MATERIALS Russian patent published in 2009 - IPC G01N23/223 

FIELD: physics.

SUBSTANCE: sample of analysed material is diluted in a controlled ratio with a diluent which does not contain elements being analysed. The sample is exposed to X-rays. Intensity of X-ray fluorescence lines of elements being analysed is measured and composition is calculated from the measured intensities. The diluent used is a compound, absorption edge of which lies between the analytical line of the main analysed element of the material and absorption edges of the rest of analysed elements.

EFFECT: increased accuracy of determining low impurity content, analytical lines of which lie in the long-wavelength part of the X-ray spectrum, in materials with high content of main element, the analytical line of which lies in the short-wavelength range of X-ray spectrum.

2 cl, 1 dwg