AUTOMATED SAMPLE PREPARATION Russian patent published in 2016 - IPC G01N1/28 H01J37/20 

FIELD: oil and gas industry; mineralogy.

SUBSTANCE: group of inventions relates to sample preparation for mineralogical analysis in electron-beam system in oil and gas and mining industries. First version of method comprises collecting a mineral sample for analysis, drying sample and dividing collected sample into a smaller representative aliquot and adding together aliquot and two components of a rapid-setting two-part fixing agent based on epoxy resin into a sample mould. Fixing agent is cured for 3 minutes and aliquot is added to fixing agent in mould, mixing aliquot and fixing agent in mould in an automating mixer. Said mixing begins within 30 seconds after adding aliquot to fixing agent in mould. Method comprises hardening of fixing agent for moulding a hardened sample workpiece in mould, cut mould and a hardened sample workpiece for removal of upper part of hardened sample workpiece and opening flat inner surface of sample, and without grinding or polishing of sample surface depositing a layer of conducting material on surface of sample to obtain a sample for analysis. Second version of method comprises combining sample with uncured fixing agent based on epoxy resin, mixing sample and a fixing agent in mould in automatic mixer. Method enables hardening of fixing agent for moulding a hardened sample workpiece in mould. Mould and a hardened sample workpiece are cut for removal of upper part of a hardened sample workpiece and opening flat inner surface of sample. Layer of conducting material is deposited on surface of sample to obtain a sample for analysis.

EFFECT: device comprises a dispensing system for dispensing of uncured fixing agent based on epoxy resin, mixing system for mixing uncured fixing agent with mineralogical sample in mould, cutter for cutting hardened fixing agent and mineral sample in mould when cutting mould itself, ensuring without grinding sufficiently smooth surface of sample for sample analysis using an electron beam.

20 cl, 12 dwg