FIELD: electronics.
SUBSTANCE: invention relates to electronic industry, field of thin-film technologies, application and control of film coatings with specified characteristics for emission electronics. Determining content of cathode active component atoms in device, which employs anti-emission material, on anti-emission material surface in one external monoatomic layer, and determining temperature range, in which active component on anti-emission material surface is absent or decreases to below allowed limit. Method and device for its implementation allow to determine temperature range by temperature lower boundary and simultaneously determine surface external monolayer composition of atoms, responsible for surface emission properties. Knowledge of composition allows to eliminate all other side effects, associated with composition, affecting emission properties, and provides higher information value and validity of results in comparison to prototype. Considerably reduced time for determination of anti-emitter temperature range.
EFFECT: technical result is increase in measurements reliability and information value.
2 cl, 2 dwg
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0 |
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Authors
Dates
2016-12-10—Published
2015-06-30—Filed