FIELD: electronics.
SUBSTANCE: invention relates to micro- and nanoelectronics, physics and can be used for analysis of information characteristics of surface of nano-structured and self-assembling solid-state materials. Essence of method is obtaining image of analyzed surface with high resolution by means of atomic force microscopy characteristics of surface are calculated using average mutual information method, analyzed surface is classified by value of entropy and degree of order.
EFFECT: analysis of information characteristics of surface of nano-structured and self-assembling solid-state materials.
1 cl, 1 dwg
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