FIELD: physics.
SUBSTANCE: system comprises an X-ray source, a detector with a plurality of the detecting strips located in the first detector direction, wherein each detecting strip comprises a plurality of pixels located in the second detector direction, a phase diffraction grid, a plurality of the analyzer diffraction grids having slits. The X-ray source and the detector are configured to perform scanning movement against the object in the first direction. The analyzer diffraction grids are located between the X-ray source and the detector, and each of the plurality of the analyzer diffraction grids is located in connection with the corresponding detecting stripe, with the slits of the diffraction grids located in the second direction. The diffraction grid slits of the detecting stripes are offset against each other in the second direction.
EFFECT: reducing the errors and increasing the signal-to-noise ratio, when the phase contrast is used in the radiography.
18 cl, 5 dwg
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