FIELD: physics.
SUBSTANCE: when performing the marking method, a defect in the moving material is recognized by the defect sensor. The signs of the material surface structure in the defect area are recognized by the first marking sensor. The first set of data structures is formed. The structure data set is memorized. The second marking sensor forms the second set of the structure data. The defect position is identified by comparing the recorded first set of the structure data with the second set of the structure data. When the data sets coincide, the operation of the processing section is controlled. The processing section processes the material in the defect area. The recognition of the material structure characteristic between the first and the second marking sensors is performed by means of an input sensor prior to changing the material surface structure in the second processing section. From the recognized characteristic of the structure, an input data set is formed. It is compared with the first set of the structure data. When the data sets coincide, the output sensor recognizes the characteristics of the material surface structure emerging from the second processing section, taking into account the passage speed through the section. The output data set is defined and stored. The defect marking device includes a defect sensor, the first marking sensor, the second marking sensor, a surface structure data set generating unit, a structure data set comparing unit, and a material processing section control unit.
EFFECT: possibility of an accurate, reliable, long-lasting marking of a material defect.
12 cl, 2 dwg
