FIELD: measuring equipment.
SUBSTANCE: invention relates to measuring equipment, in particular to devices for optical non-contact surface profile measurement, and can be used to measure the parameters of unevenness, surface roughness, for example, of a road surface, metal surfaces and complex shapes articles. Laser profilometer for determining geometric parameters of a surface profile contains a laser source with a laser beam-to-line converter, an optical matrix receiver of the reflected radiation and an information processing device. Laser source is made in the form of a semiconductor laser operating in the pulsed mode with an integrated temperature stabilization system. In the course of the reflected beam, at least one narrow-band interference light filter is introduced before the optical matrix receiver. In addition, a semiconductor laser operating in the visible red wavelength range is used, the temperature stabilization system is based on Peltier elements with a controller and a temperature sensor.
EFFECT: increasing the accuracy of the measurement by reducing the error of the profilometer while simplifying its design.
4 cl, 1 dwg
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Authors
Dates
2018-04-17—Published
2016-12-27—Filed