MICROFOCUS DEVICE OF X-RAY CONTROL Russian patent published in 2018 - IPC G21K5/08 G05G1/00 

FIELD: defectoscopy.

SUBSTANCE: invention relates to non-destructive testing and analysis facilities for a wide range of products, such as printed circuit boards, assemblies, electronic components, microassemblies and modules, etc. Device includes a structure mounted and secured within a framework consisting of rigidly connected guides, and comprises a support frame under which an X-ray tube is fixed and centrosymmetrically relative to said frame, and a detection unit optically coupled to said tube. Between these tubes and the block, a coordinate table with a pallet placed on it is placed on the support frame for the placement of the monitoring object and designed to move along the coordinate axes X, Y, and Z. Axis of the working X-ray beam of the tube is normal to the plane of the support frame. Detection unit is located above the support frame and is placed on an arcuate beam with the possibility of moving along it to the desired angle of the solution of the working beam of the X-ray radiation of the tube. Arc-shaped beam is connected to the upper frame guide by means of a fastening means fixedly mounted opposite the X-ray tube and ensuring rotation of the beam about the axis of the working X-ray beam. Beam has a working and non-working area, where the working section is designed to move the detection unit.

EFFECT: technical result consists in expanding the arsenal of technical means of microfocus X-ray devices with high operational reliability, as well as reducing the weight and dimensions of the device without deteriorating its technical characteristics.

7 cl, 4 dwg