CONSTRUCTION OF MICROSYSTEM WITH HIGH RADIATION RESISTANCE TO THE SINGLE CHARGED PARTICLES IMPACT Russian patent published in 2018 - IPC H01L27/08 

Abstract RU 2659623 C1

FIELD: electrical equipment.

SUBSTANCE: use: to create the microelectromechanical devices (MEMD) with increased radiation resistance. Summary of invention is in the fact, that in the structure of the microsystem with increased radiation resistance to the single charged particles action having mechanical part and electrical part with the fractal shape, electrical part micro capacitors plates have the Cantor set three-dimensional fractal shape.

EFFECT: enabling the possibility of the MEMD radiation damage probability reducing, excluding the microsystems failure, as well as the false data reading from them during exposure to the heavy charged particles ionizing radiation.

1 cl, 4 dwg

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RU 2 659 623 C1

Authors

Shakhnov Vadim Anatolevich

Zinchenko Lyudmila Anatolevna

Rezchikova Elena Vikentevna

Makarchuk Vladimir Vasilevich

Glushko Andrej Aleksandrovich

Terekhov Vladimir Vladimirovich

Mikhajlichenko Sergej Sergeevich

Dates

2018-07-03Published

2017-03-06Filed