INFORMATION-MEASURING SYSTEM FOR MONITORING THICKNESS AND MASS OF DIELECTRIC FLAT PRODUCTS Russian patent published in 2019 - IPC G01F1/66 

FIELD: physics.

SUBSTANCE: invention relates to information-measuring equipment and can be used for measurement of thickness and weight of flat articles from dielectric materials of semiconductor plates as blanks for electronic devices and medical products in the form of tablets and capsules at automation of technological processes of their manufacturing and control. In information-measuring system of thickness and mass of dielectric flat products containing dielectric insert with capacitor plates, in the gap between which a movable dielectric flat article is placed, and an information recording unit, made in form of a series-connected optically connected laser diode, polariser, Pockels electrooptical cell, analyzer, photodiode, output of which is connected to input of keyboard controlled microcontroller, comprising microprocessor, amplifier and analogue-to-digital converter, output of microcontroller is connected to liquid crystal display, and Pockels cell comprises an electrooptic crystal with two electrodes outside it, which are in series connected to capacitor plates, at that, on one side of the electro-optical crystal of the Pockels cell there is a flat mirror, and on the other side - a correcting plate, a polariser-light analyzer connected through optical connectors to a controller connected to a liquid crystal display and a visualization system.

EFFECT: technical result of using invention consists in improvement of measurement accuracy, simplification of technical implementation and protection against influence of external electromagnetic fields.

4 cl, 1 dwg