FIELD: measurement technology.
SUBSTANCE: invention relates to investigation of metal surfaces and semiconductors by measuring characteristics of surface electromagnetic waves (SEW) directed to it and can be used in sensor devices, absorption spectrometers and interferometers which use surface plasmon-polaritons (SPP) as a data medium, which are a variety SEW. Device for converting IR radiation into SEW on a flat face of the conductive body comprises a source of p-polarized monochromatic radiation, an optical lens, cylindrical segment, convex surface of which is able to direct SEW, is coated with dielectric layer of subwavelength thickness, has axial line perpendicular to radiation incidence plane, is limited by two acute-angled ribs in direction perpendicular to incidence plane, has line of intersection with this plane shorter than propagation length SEW and is conjugated by one of ribs with flat face of body, absorbing screen located above track SEW outside its field and oriented perpendicular both to the face and the plane of incidence, the lens is selected as collimating. Convex surface of the segment is equipped with a planar diffraction grating, the strokes of which are perpendicular to the plane of incidence. Source and the lens are mounted on a platform capable of moving along an arc whose axis coincides with the center line of the grid.
EFFECT: high efficiency of converting monochromatic infrared radiation into a surface electromagnetic wave on a flat face of a conducting body.
1 cl, 1 dwg
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Authors
Dates
2019-10-23—Published
2019-02-08—Filed