FIELD: measurement technology.
SUBSTANCE: invention relates to investigation of surface of materials by optical methods and to device for determination of propagation length of surface electromagnetic wave (SEW) of infrared range during one emission pulse. Device comprises a radiation source, a cylindrical focusing lens, a solid-state sample with a capable of guiding the SEW by a flat rectangular face, an element for converting the source radiation into a collimated SEW beam, a beam separator splitting the beam into two secondary beams, and two photoreceivers located at edges of the edges of the face illuminated with secondary beams. Conversion element is made in the form of a cylindrical segment adjoining one of the edges of the convex surface to the sample face. Beam separator is made in the form of a flat beam-splitting plate installed on the sample face and oriented perpendicular to it so that the plate crosses the SEW track originating from the conversion element at angle of 45°, wherein one of photoreceivers is arranged in radiation incidence plane, and second one – in plane perpendicular to it.
EFFECT: technical result consists in improvement of signal / noise ratio and simplification of measurement procedure.
1 cl, 1 dwg
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Authors
Dates
2019-09-04—Published
2018-12-26—Filed