METHOD OF METROLOGICAL MAINTENANCE OF MEASURING DEVICES IN THEIR OPERATION PLACES Russian patent published in 2020 - IPC G01R1/28 G01R35/00 G01R17/02 

Abstract RU 2718147 C1

FIELD: metrology.

SUBSTANCE: invention relates to methods and means of conducting metrological certification of inspected measuring devices, standards of the same or higher order. Method of metrological maintenance of measuring devices in their operation locations is formed by using a measurement system consisting of a frequency standard, a receiver of signals of precise time from GLONASS, reference transducers, performing metrological certification of measuring devices using a special software complex, which contains algorithms for mathematical processing of measurement results. Method allows improving accuracy of reproduction of units of physical values, adaptation to the decision of the supernumerary measuring tasks in places of operation of measurement devices, and also to increase metrological independence in conditions when certification of standards from structure of measuring system in higher organs is inexpedient.

EFFECT: main technical result consists in the possibility of periodical certification and self-calibration by signals of accurate time, providing higher metrological independence of the metrological maintenance system.

1 cl, 1 dwg

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RU 2 718 147 C1

Authors

Labintsev Andrej Ivanovich

Andrashitov Dmitrij Sergeevich

Lupanchuk Vladimir Yurevich

Dates

2020-03-30Published

2019-01-31Filed