FIELD: physics.
SUBSTANCE: invention relates to creation of a method and a device intended for measurement of main parameters of synthesized protective holograms made based on diffraction microstructures, for the purpose of expert analysis of authenticity and quality control of manufacturing of these holograms, which can be made on different carriers, such as metal and glass substrates, thin polymer films with metal sputtering and without it, polymer laminating films, and can be located on documents, banknotes or package of protected products. Authenticity and manufacturing quality of the synthesized protective holograms is determined by comparing the measured basic parameters of the diffraction microstructures, contained in the analysed protective hologram as with the measured parameters of the diffraction microstructures contained in the reference hologram reference sample, and with a project for making a hologram, prepared in a corresponding design system or with a description of a hologram, obtained by direct measurements using a high-resolution microscope or X-ray equipment.
EFFECT: high quality of authenticating, wider number of determined parameters of protective hologram of diffraction microstructures.
6 cl, 1 tbl, 4 dwg
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Authors
Dates
2020-05-29—Published
2019-07-29—Filed