FIELD: spectral analysis.
SUBSTANCE: invention relates to a spectral analysis device, a spectral analysis method, a method for producing a steel strip and a method for ensuring the quality of a steel strip, intended for use for analyzing the composition and / or the ratio of the components of the surface composition of the measurement object. The light receiving unit 3 includes: a polarized light dividing unit 32 configured to separate reflected light into s-polarized and p-polarized light; an s-polarized light detecting unit 34, configured to detect s-polarized light obtained by dividing it with the polarized light separating unit 32, and to output an electrical signal to the output unit 4, indicating the intensity of the detected s-polarized light; and a p-polarized light detecting unit 33, configured to detect p-polarized light obtained by dividing it by the polarized light separating unit 32, and to output an electrical signal to the output unit 4 indicating the intensity of the detected p-polarized light. The output unit 4 calculates the absorption coefficient from the intensity ratio between the s-polarized light and the p-polarized light based on the respective electrical signals outputted from the s-polarized light detecting unit 34 and the p-polarized light detecting unit 33, and calculates the composition and / or the ratio components of the surface composition of the target object P measurement using the absorption intensity corresponding to a given wavenumber.
EFFECT: technical result is an increase in the accuracy of the analysis of the composition and / or the ratio of the components of the surface composition of the measurement object, which contributes to the production of a steel strip having the required surface composition and / or the required ratio of components in the surface composition.
5 cl, 16 dwg
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Authors
Dates
2021-04-02—Published
2018-12-17—Filed