FIELD: optical instrumentation.
SUBSTANCE: invention relates to the field of optical instrumentation and relates to an ellipsometer. The ellipsometer includes a polarizer unit with a radiation source and an analyzer unit, which contains Glan-Thompson prisms, arranged in series along the optical axis. In the polarizer, two identical sets of semiconductor radiation sources covering the selected spectral range are used as a radiation source. The polarizer additionally contains two photodetectors and two beam splitters located in front of the Glan-Thompson prism and directing the radiation to the photodetectors. The analyzer block is structurally completely identical to the polarizer block.
EFFECT: invention increases sensitivity of the device, improving reproducibility of ellipsometric parameters and increasing the measurement speed.
4 cl, 2 dwg
Title | Year | Author | Number |
---|---|---|---|
ELLIPSOMETER | 0 |
|
SU1695145A1 |
SPECTRAL ELLIPSOMETER | 2003 |
|
RU2247969C1 |
ELLIPSOMETRE | 2008 |
|
RU2384835C1 |
ELLIPSOMETER | 2005 |
|
RU2302623C2 |
SPECTRAL ELLIPSOMETER | 0 |
|
SU1369471A1 |
ELLIPSOMETER | 2007 |
|
RU2351917C1 |
METHOD OF DETERMINING ELLIPSOMETRIC PARAMETERS OF AN OBJECT | 1991 |
|
RU2008652C1 |
ELLIPSOMETRIC TRANSMITTER | 1999 |
|
RU2157513C1 |
METHOD OF PERFORMING ELLIPSOMETRIC MEASUREMENTS | 0 |
|
SU1288558A1 |
SPECTROELLIPSOMETER | 0 |
|
SU1495648A1 |
Authors
Dates
2021-06-07—Published
2020-09-28—Filed