FIELD: flaw detection.
SUBSTANCE: invention relates to the field of flaw detection by the eddy current method. In the claimed method, based on the supply of an electromagnetic field of various frequencies of the excitation current ƒ with the registration of the signal-response at each of the frequencies ƒ and the calculation of the distribution of the components of the signal-response over the thickness of the product, the values of the voltage U0 induced by the eddy currents at different frequencies of the excitation current ƒ are determined on its defect-free zone, then in the controlled area of the product, the voltages U induced by the field of eddy currents at different frequencies of the excitation current ƒ are continuously recorded and the dependences of the amplitude of the introduced voltage |Uiv|=|U-U0| and the ratio of the increment in the amplitude of the introduced voltage to the increment in frequency |ΔUiv/Δƒ| on the frequency of the excitation current, on the basis of which a conclusion is made about the absence or presence of voltage concentration zones in the investigated area of the product.
EFFECT: invention increases productivity of the product diagnostics method.
1 cl, 5 dwg
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Authors
Dates
2021-08-19—Published
2020-12-24—Filed