FIELD: LEDs thermal characteristics controlling.
SUBSTANCE: invention relates to the technique of controlling the thermal characteristics of LEDs and can be used to control the quality of mounting LED crystals on a mounting plate, including LEDs as part of LED arrays and modules. A method for measuring the thermal resistance of the junction-LED housing, which consists in passing a heating current pulse of a given strength Im and duration t through the LED, approximately equal to the thermal time constant τTj-h the junction-LED housing, and in measuring the brightness of the LED radiation with a luxmeter, characterized in that immediately after the current pulse is turned on, the brightness value E0 of the LED radiation is measured, after a time ti/2 after the current pulse is turned on, the forward voltage Um on the diode and the brightness value E1 of the radiation are measured, and after a time ti after the current pulse is turned on, the brightness value E2 of the LED radiation and thermal resistance transition-LED housing is determined by the formula
,
where is the heating power dissipated by the LED, ξ is the average value of the quantum efficiency and the average temperature decay coefficient of the radiation intensity of this type of LEDs at a given current, respectively b1=ln(E1/E0); b2=ln(E2/E0).
EFFECT: LEDs thermal characteristics controlling technique improvement.
1 cl, 1 dwg
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Authors
Dates
2022-05-27—Published
2021-08-06—Filed