METHOD OF COLLECTING AND PROCESSING X-RAY DIFFRACTION MICROTOMOGRAPHY DATA Russian patent published in 2024 - IPC G01N23/20 

FIELD: data collection and processing.

SUBSTANCE: use for collection and processing of X-ray diffraction 3D microtomography data of a sample. Essence of the invention consists in the fact that diffraction data are obtained from the detector during step-by-step rotation of the sample relative to the incident X-ray beam, followed by formation of 2D images and their conversion into 3D images, wherein for different angles of rotation around the diffraction vector, the sample is adjusted in the exact Bragg position and series of 2D frames is repeatedly taken, which include intensity data, measured by X-ray 2D detector in the "transmission" mode, 2D intensity data are converted into corresponding 2D pixel image data, providing their computer storage in the form of digital arrays, one array for each angle of rotation of the sample; then generating statistically averaged 2D frame of data corresponding to a specific angle of rotation of the sample, wherein the number of collected separate 2D frames of X-ray diffraction intensity data is selected from the condition that values of the nominal deviation of the noise component in the region of the maximum intensity of statistically averaged 2D frame shall not exceed 5 % of the average intensity of 2D frame in accordance with the non-correlated data part dispersion evaluation according to the intensity value differences table in the pixel array, making a rectangular scanning window of 2D image with size of 3×3 or 5×5 pixels with centre in pixel, for which noise dispersion is estimated, then formed in this way statistically averaged 2D intensity data corresponding to different positions of the sample, is sent to a computer program for processing 2D data of X-ray diffraction microtomography, which is included in the software package of the microtomograph, wherein in 3D space, all averaged 2D frames are marked with at least one of the following parameters: position of the sample, dimensions of 2D detector, position of the detector relative to the sample, and wavelength of X-ray radiation.

EFFECT: possibility of reducing the level of random noise, as well as enabling dynamic control of the onset of radiation damage of the sample and using the detector in a linear recording mode, avoiding its overload at a long exposure time, as a result of reducing the recording time of each frame.

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