FIELD: physics.
SUBSTANCE: use for DM in a given test mode to prevent data processing errors by a circuit. Essence of the invention consists in the fact that the semiconductor memory device is in a given test mode, a first Model Register (MR) and a second MR associated with the Data Pin (DQ) are configured to directly determine the impedance of the Data Mask Pin (DM). For DM, there is no need to add determination of the state of the output signal generator and the corresponding control circuit for a given test mode in order to ensure adaptation of the given test mode to the DM.
EFFECT: enabling prevention of data processing errors by the circuit.
22 cl, 12 dwg, 3 tbl
Title | Year | Author | Number |
---|---|---|---|
CONTROL METHOD, SEMICONDUCTOR MEMORY AND ELECTRONIC DEVICE | 2022 |
|
RU2826817C1 |
CONTROL METHOD, SEMICONDUCTOR STORAGE DEVICE AND ELECTRONIC DEVICE | 2022 |
|
RU2816559C2 |
DEVICE FOR CONTROL OF MICROPROCESSOR SYSTEM | 0 |
|
SU1753474A1 |
USER TO COMMUNICATION CHANNEL INTERFACE | 0 |
|
SU1508225A1 |
APPARATUS FOR CONTROLLING AND RESTORING TECHNICAL MEANS INTENDED FOR MEDICAL USES | 1992 |
|
RU2072788C1 |
DISPLAY DEVICE | 2010 |
|
RU2489756C2 |
SEMICONDUCTOR MEMORY DEVICE | 2014 |
|
RU2641478C2 |
METHOD OF DRIVING IMAGE RECORDING DEVICE, METHOD OF CORRECTING DIGITAL SIGNAL, IMAGE RECORDING DEVICE, METHOD OF DRIVING IMAGE CAPTURING SYSTEM AND IMAGE CAPTURING SYSTEM | 2013 |
|
RU2580422C2 |
SEMICONDUCTOR DEVICE AND DISPLAY DEVICE | 2008 |
|
RU2458460C2 |
ELECTRONIC MEMORY DEVICE | 1998 |
|
RU2216796C2 |
Authors
Dates
2024-08-12—Published
2022-05-19—Filed