FIELD: instrumentation.
SUBSTANCE: invention relates to scientific instrument making and can be used in the process of measuring electrophysical properties and studying the structure of polymer samples by X-ray diffraction in the geometry of a sliding beam when creating a temperature gradient in a thin film of polymers for in situ analysis of the effect of polymer architecture on the conducting properties of the sample. Disclosed is a device for creating a temperature gradient when investigating the structure of polymer samples with thermoelectric properties by X-ray diffraction in the geometry of a sliding beam, comprising a sealed housing, in which there are: a module for creating a temperature gradient, which includes two elements located with an adjustable gap relative to each other: a heater and a refrigerator, the working faces of which are located in the same plane; a substrate for placing a polymer sample, having contact pads for picking up thermoelectric parameters of the sample; a base on which there is a linear movement system of the heater and refrigerator, an electronics unit designed to control the device and record electrophysical parameters of the sample.
EFFECT: creation of a directed temperature gradient in the volume of the sample in a wide range of temperature gradient (ΔT about 400 °C) with simultaneous X-ray structural analysis.
8 cl, 5 dwg
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Authors
Dates
2024-12-17—Published
2024-05-08—Filed