FIELD: computer engineering.
SUBSTANCE: method of developing Serial Peripheral Interface (SPI) devices, comprising developing an SPI device; based on hardware modules, creating semi-natural models (SM) of previously developed SPI devices; in projects of developed SM of SPI devices, faults of duration of clock signals are deliberately introduced and all developed models are connected to each other and to SPI devices, which are objects of development and testing; tests are performed without introducing faults of duration of clock signals in order to assess the correct functioning of development and test objects, after which tests are carried out with intentionally introduced faults of the SM in order to assess the correct functioning of development and test objects with presence of faults; if the developed SPI device (DD), after receiving electrical signals containing faulty clock signals, does not function properly, then the SPI DD is modified and the test process is repeated again with corresponding control by measuring electrical signals until it functions correctly.
EFFECT: increased survivability, reliability and durability developed devices.
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Authors
Dates
2025-01-16—Published
2024-05-08—Filed