FIELD: manufacture of semiconductor structures. SUBSTANCE: in silicon structure manufacture additional seed operations are used. These operations are made in the course of growth of polycrystal silicon layer after definite thickness d (microns) is attained. Thickness is selected from condition 30 ≅ d ≅ A-30, where A (microns) is thickness of polycrystalline silicon after flattening operation in parallel to back side of monocrystalline silicon plate. EFFECT: increased output of serviceable structures due to improvement of mechanical strength of polycrystalline silicon layer. 4 dwg
| Title | Year | Author | Number | 
|---|---|---|---|
| METHOD OF MANUFACTURING SEMICONDUCTIVE STRUCTURES | 1984 | 
									
  | 
                SU1264440A1 | 
| METHOD OF MANUFACTURING EPITAXIAL SILICON STRUCTURES | 1982 | 
									
  | 
                SU1056807A1 | 
| SILICON SEMICONDUCTOR PLATE OF NEW TYPE AND PROCESS OF ITS MANUFACTURE | 1994 | 
									
  | 
                RU2141702C1 | 
| METHOD OF MANUFACTURE OF HIGH-VOLTAGE INTEGRATED CIRCUITS WITH DIELECTRIC INSULATION | 1990 | 
									
  | 
                SU1739805A1 | 
| SiC CRYSTAL WITH DIAMETRE OF 100 mm AND METHOD OF ITS GROWING ON OFF-AXIS SEED | 2007 | 
									
  | 
                RU2418891C9 | 
| MONOCRYSTAL SiC AND METHOD OF ITS PRODUCTION | 1998 | 
									
  | 
                RU2160327C2 | 
| METHOD OF MAKING COMPOSITE POLYCRYSTALLINE AND MONOCRYSTALLINE DIAMOND PLATE | 2012 | 
									
  | 
                RU2489532C1 | 
| METHOD OF MONOCRYSTALS GROWING FROM MELT | 2003 | 
									
  | 
                RU2222646C1 | 
| MONOCRYSTAL SILICON CARBIDE AND METHOD OF ITS PRODUCTION | 1998 | 
									
  | 
                RU2160227C2 | 
| METHOD FOR PRODUCING SUBSTRATE BASED ON SILICON CARBIDE AND SILICON CARBIDE SUBSTRATE | 2018 | 
									
  | 
                RU2756815C2 | 
Authors
Dates
1994-09-30—Published
1985-08-16—Filed