METHOD OF TESTING DIGITAL INTEGRATED CIRCUITS Russian patent published in 1994 - IPC

FIELD: testing of digital integrated circuits. SUBSTANCE: all the element of integrated circuit are introduced into dynamic mode at transient part of output switching characteristic at frequencies onto which forming of logic signals inside and at outputs of integrated circuit is absent. Electric bias and variable signals are applied to inputs of integrated circuit. Amplitudes of variable signals are within transient part of switching characteristic at different combinations of phases of variable signals. Frequency is kept at the level when amplitudes of corresponding variable signals at outputs of integrated circuit are kept within the limits of transient part of switching characteristic. EFFECT: improved value of forced load; improved uniformity of the load. 1 dwg