METHOD OF TESTING DIGITAL INTEGRATED MICROCIRCUITS Russian patent published in 1994 - IPC

FIELD: electronics. SUBSTANCE: method involves the steps pf: applying logic signals from generator 1, electric bias voltage from source 2 and calibrated variable signals from generator 3 phase and amplitude relationships between which are set by phase shifter 4 and amplitude modulator 5 through synchronized switching unit 6 and 7 and amplitude regulators 8 and 9 to the inputs of microcircuit 10 to be tested and to standard one 11, applying signals from the latter to comparison unit 12 and indicator unit 12, providing a desired operating mode with regard to direct current or DC voltage with the aid of source 14, setting bias voltage amplitudes of variable input, signals and their repetition rate such that amplitudes of output signals from microcircuits 10 and 11 at all combinations of phase and amplitude relationships between variable input signals remain within a transition portion of switching characteristic of microcircuit, equalizing amplitudes of output signals of microcircuits 10 and 11 in a fixed transmission path of signals with the aid of amplitude regulators 8 and 9 prior to testing, estimating operability of microcircuit 10 by comparing variable output signals of microcircuit at different phase and amplitude relationships between variable input signals, repetition rate and electric bias voltage values. EFFECT: enhanced reliability, reduced test time. 1 dwg