FIELD: measurement technology. SUBSTANCE: noise temperature of waveguide amplifiers is measured accomplished with frequency conversion at working ranges of input frequencies which are wider than 37,5 GHz, onto which reference noise sources are absent with noise temperature lower and at temperature being higher than environment temperature. Noise signal from output of amplifier to be measured is applied to input of amplifier certified for noise temperature. After or before that the above mentioned noise signal is applied input of the amplifier with noise environment temperature To. Relation M of levels of power of noise signal is measured at output of the amplifier. Noise temperature Tnoise of amplifier to be measured is determined from the relation given in the description of the invention. EFFECT: widened area of application.
