FIELD: semiconductor technology. SUBSTANCE: MIS large-scale integrated circuit is manufactured by well known technology, is irradiated with ultraviolet radiation for adjustment of threshold voltage. Different groups of MIS structures (for instance, n- and p-channel transistors) in HEMOS require in common case equal value of adjustment ΔV1 and ΔV2. Condition that relation between adjustment coefficients K1 and K2 depends on ratio of intensities of ultraviolet and X-ray radiations Iul/Ix-ray is used. Processing from experimental dependences K1=f1(Iul/Ix-ray) and K2= f2(Iul/Ix-ray) value Iul/Ix-ray is set at which relation K1/K2=ΔV2/ΔV1 is realized. Dosage of X-ray radiation is established equal to D = K1ΔV1= K2ΔV2. EFFECT: enhanced operational reliability of manufactured MIS LSI circuits. 4 dwg
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Authors
Dates
1995-08-20—Published
1990-05-21—Filed