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(19)

RU

(11)

2 020 643

(13)

C1

(51)

IPC

(21) (22)

Application

4613422/21, 1989-01-20

(22)

Actual filing date

1989-01-20

(45)

Published

1994-09-30

(72)

Inventor

Мankuzo Dzhejms F.[Us]Мaksvell Vil'Jam В.[Us]Danilatos Dzherasimos D.[Au]

(73)

Holder

Еhlektroskehn Кorporejshn

ELECTRONIC MICROSCOPE Russian patent published in 1994 - IPC

Abstract RU 2020643 C1

FIELD: electronic microscopy. SUBSTANCE: specimen holder is placed in electronic microscope in gas atmosphere of chamber at gas pressure not lower than 0.05 T. Detecting electrode is placed at distance 1 to 200 mm from specimen surface level and voltage is fed to it from regulated 50-2000 V source. EFFECT: eliminated firing of self-tearing in chamber gas. 1 dwg

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RU 2 020 643 C1

Authors

Мankuzo Dzhejms F.[Us]

Мaksvell Vil'Jam В.[Us]

Danilatos Dzherasimos D.[Au]

Dates

1994-09-30—Published

1989-01-20—Filed

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