FIELD: photoscanning tunnel microscopy. SUBSTANCE: near-zone vanishing field is generated adjacent to specimen surface by generating interface between first and second substances with different refraction indices, beam is passed through first substance so that it crosses interface at angle larger than full internal reflection angle and field contacting interface of second substance, which is specimen, is produced. Radiation of vanishing near-zone field is checked by means of probe placed in this field zone to obtain radiation of this field. Output signal proportional to respective properties of this field is produced. Near-zone vanishing field is generated at increased intensity in direction perpendicular to specimen surface thereby affording its constant intensity while maintaining constant distance from surface. Near-zone field can be checked by scanning the probe in raster adjacent to specimen region. EFFECT: enlarged functional capabilities. 5 cl, 5 dwg
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Authors
Dates
1995-11-27—Published
1989-10-20—Filed