FIELD: electronic equipment; can be used in photoelectric power, mainly in solar cells at conversion of high-density radiation. SUBSTANCE: low-resistance contact uses a transition layer of nickel silicide, 0.02 to 0.08 um thick; nickel layer 0.2 to 1.0 um thick; copper layer 3 to 8 um thick; and a layer of tin-containing solder, 3 to 10 um thick. Nickel silicide provides for a low contact resistance of the contact; the nickel layer serves as a shield against diffusion of copper to silicon; the copper layer provides for a low resistance of the contact. EFFECT: enhanced efficiency. 1 dwg
Title | Year | Author | Number |
---|---|---|---|
PROCESS OF MANUFACTURE OF SOLAR BATTERIES | 1991 |
|
RU2035091C1 |
CONTACT FOR SILICIUM SOLAR ELEMENT | 0 |
|
SU1635843A1 |
SOLAR CELL | 0 |
|
SU1790015A1 |
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RU2392694C2 |
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SEMICONDUCTOR CHIP MANUFACTURING PROCESS | 1992 |
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RU2012094C1 |
SEMICONDUCTOR CHIP MANUFACTURING PROCESS | 1992 |
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CONTACT SYSTEM FOR PHOTOELECTRIC TRANSDUCERS | 1987 |
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RU1464831C |
METHOD OF MAKING SHORT-RANGE PARTICLE DETECTOR | 2008 |
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RU2378738C1 |
Authors
Dates
1996-08-10—Published
1994-06-01—Filed