METHOD FOR WRITING DATA WHEN MEMORY UNIT IS BEING TESTED AND MEMORY-TESTING DEVICE Russian patent published in 1997 - IPC

Abstract RU 2084972 C1

FIELD: computer engineering. SUBSTANCE: device has data writing units, data testing units and control unit. Corresponding method involves generation of voltage difference between pair of bit lines B/L and , and direct data storing to capacitor of memory gate. Direct writing to bit lines is possible according to this invention. In addition each memory gate may be checked during single cycle. EFFECT: increased speed of testing. 4 cl, 1 dwg

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RU 2 084 972 C1

Authors

Khun Choj[Kr]

Dates

1997-07-20—Published

1990-06-08—Filed