FIELD: electronics. SUBSTANCE: method visualizing image of examined object emitting charged particles limits lateral displacement of particles by creation of magnetic field along path of movement of particles from examined object to screen. Magnetic field uniformly decreases from area of location of object towards screen with adherence to execution of condition of adiabatic invariance of movement of charged particles in magnetic field. Magnetic emission microscope has multiturn coil for creation of magnetic field, element for attachment of examined object and screen. Coil has diminishing number of turns in correspondence with calculated relationship providing for formation of trajectories of magnetic lines of force in the form of straight lines diverging with reference to axis. Space inside coil has cone-shaped form and houses vacuum chamber in the form of truncated cone. Element for attachment of examined object is positioned close to base of chamber having smaller section. Screen is mounted by base of chamber having bigger section. EFFECT: magnified images of examined objects with simultaneous rise of resolution, generation of structure of object over depth. 5 cl, 2 dwg
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Authors
Dates
1998-01-10—Published
1996-06-21—Filed