METHOD FOR PRODUCTION OF SEMICONDUCTOR PHOTODETECTOR Russian patent published in 1999 - IPC

Abstract RU 2127472 C1

FIELD: renewable power sources. SUBSTANCE: before baking chips from n-type silicon method involves orientation in same crystal axis and baking chips with aluminum foil in column under temperature of 650-750 C. Chip is heated up to this temperature for 10-60 min, kept for 5-30 min and cooled with temperature gradient of about 20-80 C per hour. Then column is cut into structures, contact system is developed on back side of chips and coated. EFFECT: increased efficiency, reliability and durability of photodetectors, decreased power consumption for their manufacturing. 2 cl, 2 dwg

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RU 2 127 472 C1

Authors

Tjukhov I.I.

Strebkov D.S.

Simakin V.V.

Dates

1999-03-10Published

1996-03-28Filed