FIELD: manufacture of solid microelectronic devices. SUBSTANCE: process of plasma-chemical pickling of silicon-carrying materials includes pickling through polymer resistive mask with plasma-forming mixture containing sulfur hexafluoride (SF6), carbon tetrachloride (CCl4), acetone (C3H6O2) and argon Ar with following percentage of components, volume per cent: CCl4 3.0.-7.0; Ar 10.0-13.0; C3H6O2 12.0-16.0, SF6 being the balance. EFFECT: provision for assured pickling of functional layers of different thickness in solid microelectronic devices through polymer resistive masks thanks to increased resistance of masks in process of pickling.
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Authors
Dates
1999-11-20—Published
1997-05-22—Filed