FIELD: electronic engineering. SUBSTANCE: method involves enrichment of source silicon ingot with N-times stable isotope 30Si and its irradiation with neutrons. According to main nuclear reaction (n, γ), desired concentration of donor 30Si is obtained on stable isotope 31P contained in natural mixture of silicon isotopes. Then ingot is decontaminated, subjected to radiometric check-up and to high-temperature annealing for eliminating essential portion of radiation defects and for stabilizing electrophysical properties of material. According to first option, fluence rating of neutrons is reduced N times thereby reducing concentration of radiation defects to the same degree. According to second option, fluence rating specified for irradiating silicon with natural isotope mixture is maintained, N times higher concentration of donor 31P and, hence, concentration of charge carriers, is obtained. For reducing amount of complex radiation defects that cannot be eliminated by post-irradiation high- temperature annealing when using second method, proportion of high-energy neutrons is reduced by means of neutron spectrum moderator. EFFECT: reduced amount of complex radiation defects and improved electrophysical properties of silicon. 2 cl, 1 dwg
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Authors
Dates
2000-01-27—Published
1998-03-19—Filed