FIELD: X-ray microscopy. SUBSTANCE: invention refers to X-ray radiation sources having small effective size of radiation area and is intended for use in X-ray microscopes, microflaw detectors and X-ray tomographs. Point high-intensity source has electron emitter, electron focusing lenses and radiation leakage anode that can be installed in window of radiation source and provided with aid for its cooling. Electron beam is focused in point or dash behind anode in path of electron beam. Pupil of diaphragm of X-ray radiation is positioned in focus of electron lens. EFFECT: diminished effective size of radiation region. 6 cl, 3 dwg
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