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Application

2000104664/28, 2000-02-24

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Start date

2000-02-24

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Actual filing date

2000-02-24

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Published

2001-11-10

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Inventor

Leun E.V.Serebrjakov V.P.Shulepov A.V.Zagrebel'Nyj V.E.Rozhkov N.F.Vasilenko A.N.

(73)

Holder

Moskovskij Gosudarstvennyj Tekhnologicheskij Universitet

METHOD OF DETERMINATION OF DEVIATION FROM LINEARITY Russian patent published in 2001 - IPC

Abstract RU 2175753 C1

FIELD: measurement technology; determination of deviation from linearity. SUBSTANCE: method consists in forming set of diffraction orders of different frequencies due to conversion of laser radiation and two groups of diffraction orders are made from it. Each group of diffraction orders forms two interference patterns. Then, two output signals are obtained due to conversion of interference patterns. Shift of object is judged from proportional change in frequency of output signals. EFFECT: reduced number of photodetectors at simultaneous increase of number of coordinates under test. 4 dwg

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RU 2 175 753 C1

Authors

Leun E.V.

Serebrjakov V.P.

Shulepov A.V.

Zagrebel'Nyj V.E.

Rozhkov N.F.

Vasilenko A.N.

Dates

2001-11-10—Published

2000-02-24—Filed

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