METHOD OF NENODESTRUCTIVE INSPECTION OF THICKNESS OF LAYERS OF BIMETAL BAND Russian patent published in 2006 - IPC G01B15/02 

FIELD: nondestructive inspection.

SUBSTANCE: bimetal band to be inspected is exposed to radiation by direct collimated flux from X-ray radiation source. Then direct radiation flux is primarily detected after it exposed band to radiation. Then secondary detection is carried out for flux reflected from structure of material of bimetal band. Detected signals are processed and are subject to visual reproduction. Collimation of direct radiation flux is made in form of thin-flat shape which has width to be equal or shorter than width of band. Received narrow direct flux bundle is oriented along cross-section of band and in perpendicular to longitudinal axis of symmetry of the band. Before secondary detection, reflected radiation flux is repeatedly collimated into shape being identical to shape of direct flux. Received narrow direct flux bundle is subject to scanning at sped being 5-10 times higher than linear speed of motion of band along its axis of symmetry.

EFFECT: improved resolution; improved precision of measurement.

1 dwg