POWER PROBE MADE ON THE BASE OF QUARTZ CRYSTAL VIBRATOR Russian patent published in 2005 - IPC

Abstract RU 2251071 C2

FIELD: device providing receiving of information on condition of object's surface.

SUBSTANCE: device can be used for inspecting surfaces of objects at tunnel and atomic-power modes of operation in scanning probe microscope. Power probe for scanning probe microscope has quartz crystal vibrator provided with needle fixed at surface of one arm of quartz vibrator due to chemical bond between needle and surface. There are variants of the device where thread-shaped crystals are used as needles and nanotubes. Thread-shaped crystals can be made of carbon, metal, semiconductor and isolator. Needles can be also fixed at external surface of arm of quartz vibrator as well as its edge and side surfaces. Needles can be arranges as in parallel to axis of symmetry of quartz vibrator and in perpendicular to its axis. According to one more variant, needle can be fixed at random angle to axis of plane of one arm of quartz vibrator. In some cases surface of arm of quartz vibrator can used for fixing several needles of different lengths.

EFFECT: improved sensitivity of probe; widened operational capabilities.

12 cl, 6 dwg

Similar patents RU2251071C2

Title Year Author Number
PROBE SENSOR BASED ON QUARTZ RESONATOR FOR SCANNING PROBE MICROSCOPE 2005
  • Sokolov Dmitrij Jur'Evich
RU2297053C1
PROBE BASED ON QUARTZ RESONATOR FOR SCANNING PROBE MICROSCOPE 2005
  • Sokolov Dmitrij Jur'Evich
RU2297054C1
PROBE ON BASE OF QUARTZ CRYSTAL VIBRATOR FOR SCANNING PROBE MICROSCOPE 2001
  • Bykov V.A.
  • Medvedev B.K.
  • Saunin S.A.
  • Sokolov D.Ju.
RU2208763C1
PROBE BASED ON PIEZO-CERAMIC PIPE FOR SCANNING PROBE MICROSCOPE 2005
  • Bykov Viktor Aleksandrovich
  • Golubok Aleksandr Olegovich
  • Sapozhnikov Ivan Dmitrievich
RU2300150C1
SCANNING PROBE MICROSCOPE COMBINED WITH DEVICE FOR MODIFYING SURFACE OF OBJECT 2008
  • Efimov Anton Evgen'Evich
  • Martin Mjuller
  • Matsko Nadezhda Borisovna
RU2389032C2
CONTROL UNIT FOR SCANNING PROBE MICROSCOPES 2007
  • Bykov Viktor Aleksandrovich
  • Bykov Andrej Viktorovich
  • Kotov Vladimir Valer'Evich
RU2428700C2
METHOD OF MANUFACTURING PROBES BASED ON QUARTZ RESONATORS 2006
  • Sokolov Dmitrij Jur'Evich
  • Kosobrodova Elena Anatol'Evna
RU2402782C2
POINT STRUCTURES, DEVICES BUILT AROUND THEM, AND THEIR MANUFACTURING METHODS 2000
  • Givargizov E.I.
  • Givargizov M.E.
RU2240623C2
SCANNING MICROSCOPE PROBE 2019
  • Slobodyan Stepan Mikhajlovich
  • Barchukov Dmitrij Anatolevich
RU2708530C1
NANOSONDE OF SCANNING MICROSCOPE 2018
  • Barchukov Dmitrij Anatolevich
  • Slobodyan Stepan Mikhajlovich
RU2687180C1

RU 2 251 071 C2

Authors

Bykov V.A.

Medvedev B.K.

Saunin S.A.

Mikhajlov G.M.

Dates

2005-04-27Published

2003-06-05Filed