METHOD FOR PROVIDING FOR RELIABILITY OF INTEGRATION CIRCUITS IN PROCESS OF SERIAL MANUFACTURE Russian patent published in 2006 - IPC G01R31/28 H01L21/66 

FIELD: microelectronics, in particular, technology for serial production of integration circuits.

SUBSTANCE: method includes performing electro-thermo-training of batches of integration circuits, control of electric parameters of integration circuits of batch. During quality control of integration circuits no more than 0,4% of them and more than 90% by electric parameters of electro-thermo-training are replaced by thermo-training. Time of thermo-training should not be less than time of electro-thermo-training. Temperature of effect during thermo-training is increased by value ΔT=P×R_T, where: P - power of emission of integration circuit during electro-thermal-training; R_T - thermal resistance crystal-substance.

EFFECT: decreased laboriousness and costs without decrease in efficiency.